The device use both Magnetic Method to measure the non-magnetic coating on a magnetic metal substrate and Eddy Current Method to measure the non-conductive coating on a non-magnetic metal substrate.
Magnetic Method (F-type probe)
When the probe contacts the cover layer, the probe and magnetic substrate forms a closed magnetic circuit; Due to the presence of non-magnetic coating, magnetic resistance changes. The thickness of the cover layer can be derived by measuring the change.
Eddy Current Method (NF-type probe)
When the probe contacts the cover layer, the probe and non-magnetic substrate forms Eddy Current and gives feedback to the coil inside the probe.
The thickness of the cover layer can be derived by measuring the feedback.
2. Single-point or two-point method could be used to correct probe system deviation, in order to ensure the accuracy of the device in the process of measuring.
3. Automatic identify ferrous and non-ferrous substrate quickly.
4. Power voltage indicator.
5. Speaker beep while operating.
6. Power-off automatically when idle; manually power-off available.
7. Negative display function to ensure the accuracy of zero point calibration.
Contact: Mr.Jackie Qian
Phone: +86-15952537616
Tel: +86-4006755880
Email: 2507988077@qq.com
Add: Rm601, Building 38, Dongwan Technology Innovation Center, Shenlongtou, Chuyun Road, Buji Street, Longgang, Shenzhen,P.R.C