WH83(Fe and NFe,0-1500um)

The device use both Magnetic Method to measure the non-magnetic coating on a magnetic metal substrate and Eddy Current Method to measure the non-conductive coating on a non-magnetic metal substrate.

 

 

 

Magnetic Method (F-type probe)

When the probe contacts the cover layer, the probe and magnetic substrate forms a closed magnetic circuit; Due to the presence of non-magnetic coating, magnetic resistance changes. The thickness of the cover layer can be derived by measuring the change.

 

Eddy Current Method (NF-type probe)

When the probe contacts the cover layer, the probe and non-magnetic substrate forms Eddy Current and gives feedback to the coil inside the probe.

The thickness of the cover layer can be derived by measuring the feedback.

 

 

Features

1. Thickness measurement using both Magnetic Method to measure the non-magnetic coating on a magnetic metal substrate and Eddy Current Method to measure the non-conductive coating on a non-magnetic metal substrate.

 

2. Single-point or two-point method could be used to correct probe system deviation, in order to ensure the accuracy of the device in the process of measuring.

3. Automatic identify ferrous and non-ferrous substrate quickly.

4. Power voltage indicator.

5. Speaker beep while operating.

6. Power-off automatically when idle; manually power-off available.

7. Negative display function to ensure the accuracy of zero point calibration.