The device use both Magnetic Method to measure the non-magnetic coating on a magnetic metal substrate and Eddy Current Method to measure the non-conductive coating on a non-magnetic metal substrate.
Magnetic Method (F-type probe)
When the probe contacts the cover layer, the probe and magnetic substrate forms a closed magnetic circuit; Due to the presence of non-magnetic coating, magnetic resistance changes. The thickness of the cover layer can be derived by measuring the change.
Eddy Current Method (NF-type probe)
When the probe contacts the cover layer, the probe and non-magnetic substrate forms Eddy Current and gives feedback to the coil inside the probe.
The thickness of the cover layer can be derived by measuring the feedback.
Model |
WH81 |
WH82 |
Principle |
Magnetic Method (F-type probe) |
Magnetic Method (F-type probe) & Eddy Current Method (NF-type probe) |
Range |
0-1250um |
0-1500um |
Accuracy error |
zero calibration ± (1 + 3% H); two-point calibration ± [(1% ~ 3% H)] H + 1.5 |
/ |
Power |
2 * AA battery |
/ |
Unit |
Um/mil |
/ |
Temperature |
0-40 ℃ |
/ |
humidity |
≤85% |
/ |
Minimum substrate |
10 * 10mm |
/ |
Minimum curvature |
5mm convex; 5mm concave |
/ |
Thinnest substrate |
0.4mm |
/ |
lWeight |
99g |
/ |
lSize |
110mm * 65mm * 30mm |
/ |
Name |
Quantity |
Meter device |
1 |
Standard films |
5 |
Base substrate |
1/2 |
5 dry cell |
2 |
Packing box |
1 |
User Manual |
1 |
Contact: Mr.Jackie Qian
Phone: +86-15952537616
Tel: +86-4006755880
Email: 2507988077@qq.com
Add: Rm601, Building 38, Dongwan Technology Innovation Center, Shenlongtou, Chuyun Road, Buji Street, Longgang, Shenzhen,P.R.C