The device use both Magnetic Method to measure the non-magnetic coating on a magnetic metal substrate and Eddy Current Method to measure the non-conductive coating on a non-magnetic metal substrate.
Magnetic Method (F-type probe)
When the probe contacts the cover layer, the probe and magnetic substrate forms a closed magnetic circuit; Due to the presence of non-magnetic coating, magnetic resistance changes. The thickness of the cover layer can be derived by measuring the change.
Eddy Current Method (NF-type probe)
When the probe contacts the cover layer, the probe and non-magnetic substrate forms Eddy Current and gives feedback to the coil inside the probe.
The thickness of the cover layer can be derived by measuring the feedback.
|
Model |
WH81 |
WH82 |
|
Principle |
Magnetic Method (F-type probe) |
Magnetic Method (F-type probe) & Eddy Current Method (NF-type probe) |
|
Range |
0-1250um |
0-1500um |
|
Accuracy error |
zero calibration ± (1 + 3% H); two-point calibration ± [(1% ~ 3% H)] H + 1.5 |
/ |
|
Power |
2 * AA battery |
/ |
|
Unit |
Um/mil |
/ |
|
Temperature |
0-40 ℃ |
/ |
|
humidity |
≤85% |
/ |
|
Minimum substrate |
10 * 10mm |
/ |
|
Minimum curvature |
5mm convex; 5mm concave |
/ |
|
Thinnest substrate |
0.4mm |
/ |
|
lWeight |
99g |
/ |
|
lSize |
110mm * 65mm * 30mm |
/ |
|
Name |
Quantity |
|
Meter device |
1 |
|
Standard films |
5 |
|
Base substrate |
1/2 |
|
5 dry cell |
2 |
|
Packing box |
1 |
|
User Manual |
1 |
Contact: Mr.Jackie Xu
Phone: +86 18938072212
Tel: +86-0755-23023660-808
Email: sales@fruglobal.com
Add: 4th Floor, Building 40, Dongwan Technology Innovation Center, Shenlongtou, Chuyun Road, Buji Street, Longgang, Shenzhen,P.R.C